Critical path tracing - an alternative to fault simulation

Authors:
M. Abramovici;P. R. Menon;D. T. Miller
Affiliations:
Bell Laboratories, Naperville, Illinois;Bell Laboratories, Naperville, Illinois;Bell Laboratories, Naperville, Illinois
Venue:
DAC '83 Proceedings of the 20th Design Automation Conference
Year:
1983

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Abstract

We present an alternative to fault simulation, referred to as critical path tracing, that determines the faults detected by a set of tests using a backtracing algorithm starting at the primary outputs of a circuit. Critical path tracing is an approximate method, but the approximations introduced occur seldom and do not affect its usefulness. This method is more efficient than conventional fault simulation.