Tuning dynamic data flow analysis to support design understanding

Authors:
Jan Malburg;Alexander Finder;Görschwin Fey
Affiliations:
University of Bremen, Bremen, Germany;University of Bremen, Bremen, Germany;University of Bremen, Bremen, Germany and German Aerospace Center, Bremen, Germany
Venue:
Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2013

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Abstract

Modern chip designs are getting more and more complex. To fulfill tight time-to-market constraints, third-party blocks and parts from previous designs are reused. However, these are often poorly documented, making it hard for a designer to understand the code. Therefore, automatic approaches are required which extract information about the design and support developers in understanding the design. In this paper we introduce a new dynamic data flow analysis tuned to automate design understanding. We present the use of the approach for feature localization and for understanding the design's data flow. In the evaluation, our analysis improves feature localization by reducing the uncertainty by 41% to 98% compared to a previous approach using coverage metrics.