Automated feature localization for hardware designs using coverage metrics

  • Authors:
  • Jan Malburg;Alexander Finder;Görschwin Fey

  • Affiliations:
  • University of Bremen, Bremen, Germany;University of Bremen, Bremen, Germany;University of Bremen, Bremen, Germany, and German Aerospace Center, Bremen, Germany

  • Venue:
  • Proceedings of the 49th Annual Design Automation Conference
  • Year:
  • 2012

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Abstract

Due to the increasing complexity modern System on Chip designs are developed by large design teams. In addition, existing design blocks are re-used such that the knowledge about these parts of the design entirely depends on the quality of the documentation. For a single designer it is almost impossible to have detailed knowledge about all blocks and their interaction. We introduce a simulation-based automation technique to support design understanding. Based on use cases provided by the designer and on their coverage information, the proposed technique identifies parts of the source code that are relevant for a certain functional feature. In two case studies the technique is shown to be at least as exact as reading the documentation with two important advantages: the automated approach is fast and more precise than the existing documentation for the inspected designs.