On the Accuracy of Spectrum-based Fault Localization

  • Authors:

  • Rui Abreu;Peter Zoeteweij;Arjan J. C. van Gemund

  • Affiliations:

  • Delft University of Technology;Delft University of Technology;Delft University of Technology

  • Venue:
  • TAICPART-MUTATION '07 Proceedings of the Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION
  • Year:
  • 2007

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Abstract

Spectrum-based fault localization shortens the test- diagnose-repair cycle by reducing the debugging effort. As a light-weight automated diagnosis technique it can easily be integrated with existing testing schemes. How- ever, as no model of the system is taken into account, its diagnostic accuracy is inherently limited. Using the Siemens Set benchmark, we investigate this diag- nostic accuracy as a function of several parameters (such as quality and quantity of the program spectra collected during the execution of the system), some of which directly relate to test design. Our results indicate that the superior performance of a particular similar- ity coeficient, used to analyze the program spectra, is largely independent of test design. Furthermore, near- optimal diagnostic accuracy (exonerating about 80% of the blocks of code on average) is already obtained for low-quality error observations and limited numbers of test cases. The influence of the number of test cases is of primary importance for continuous (embedded) processing applications, where only limited observation horizons can be maintained.