Automatic software fault localization using generic program invariants

  • Authors:
  • Rui Abreu;Alberto González;Peter Zoeteweij;Arjan J. C. van Gemund

  • Affiliations:
  • Delft University of Technology, The Netherlands;Delft University of Technology, The Netherlands and Universidad de Valladolid, Spain;Delft University of Technology, The Netherlands;Delft University of Technology, The Netherlands

  • Venue:
  • Proceedings of the 2008 ACM symposium on Applied computing
  • Year:
  • 2008

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Abstract

Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of low-cost, generic invariants ("screeners") in their capacity of error detectors within a spectrum-based fault localization (SFL) approach aimed to diagnose program defects in the operational phase. The screeners considered are simple bit-mask and range invariants that screen every load/store and function argument/return program point. Their generic nature allows them to be automatically instrumented without any programmer-effort, while training is straightforward given the test cases available in the development phase. Experiments based on the Siemens program set demonstrate diagnostic performance that is similar to the traditional, development-time application of SFL based on the program pass/fail information known before-hand. This diagnostic performance is currently attained at an average 14% screener execution time overhead, but this overhead can be reduced at limited performance penalty.