PIE: A Dynamic Failure-Based Technique
IEEE Transactions on Software Engineering
Visualization of test information to assist fault localization
Proceedings of the 24th International Conference on Software Engineering
Bug isolation via remote program sampling
PLDI '03 Proceedings of the ACM SIGPLAN 2003 conference on Programming language design and implementation
Detecting and Debugging Insecure Information Flows
ISSRE '04 Proceedings of the 15th International Symposium on Software Reliability Engineering
Locating causes of program failures
Proceedings of the 27th international conference on Software engineering
Scalable statistical bug isolation
Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation
Lightweight bug localization with AMPLE
Proceedings of the sixth international symposium on Automated analysis-driven debugging
Empirical Software Engineering
Empirical evaluation of the tarantula automatic fault-localization technique
Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering
Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering
Avoiding coincidental correctness in boundary value analysis
ACM Transactions on Software Engineering and Methodology (TOSEM)
Statistical Debugging: A Hypothesis Testing-Based Approach
IEEE Transactions on Software Engineering
A Technique for Enabling and Supporting Debugging of Field Failures
ICSE '07 Proceedings of the 29th international conference on Software Engineering
Search Algorithms for Regression Test Case Prioritization
IEEE Transactions on Software Engineering
An Empirical Study of Test Case Filtering Techniques Based on Exercising Information Flows
IEEE Transactions on Software Engineering
On the Accuracy of Spectrum-based Fault Localization
TAICPART-MUTATION '07 Proceedings of the Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION
Algorithms and tool support for dynamic information flow analysis
Information and Software Technology
Lightweight fault-localization using multiple coverage types
ICSE '09 Proceedings of the 31st International Conference on Software Engineering
ICSE '09 Proceedings of the 31st International Conference on Software Engineering
Measuring the strength of information flows in programs
ACM Transactions on Software Engineering and Methodology (TOSEM)
Fault localization based on information flow coverage
Software Testing, Verification & Reliability
Locating faults using multiple spectra-specific models
Proceedings of the 2011 ACM Symposium on Applied Computing
Mutation-oriented test data augmentation for GUI software fault localization
Information and Software Technology
Prevalence of coincidental correctness and mitigation of its impact on fault localization
ACM Transactions on Software Engineering and Methodology (TOSEM)
Generating profile-based signatures for online intrusion and failure detection
Information and Software Technology
Hi-index | 0.00 |
Coverage-based fault localization techniques typically assign a suspiciousness rank to the statements in a program following an analysis of the coverage of certain types of program elements by the failing and passing runs. The effectiveness of existing techniques has been limited despite the fact that researchers have explored various suspiciousness metrics, ranking strategies, and types of program elements. This work aims at identifying the factors that impair coverage-based fault localization. Specifically, we conducted an empirical study in which we assessed the prevalence of the following scenarios: 1) the condition for failure is met but the program does not fail; 2) the faulty statement is executed but the program does not fail; 3) the failure is correlated with a combination of more than one program element possibly of different types; 4) a large number of program elements occurred in all failing runs but in no passing runs. The study was conducted using 148 seeded versions of ten Java programs which included three releases of NanoXML, and seven programs from the Siemens test suite that were converted to Java. The results showed that most of the above scenarios occur frequently.