An empirical study of the factors that reduce the effectiveness of coverage-based fault localization
Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)
Property based coverage criterion
Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)
An empirical evaluation to study benefits of visual versus textual test coverage information
TAIC PART'10 Proceedings of the 5th international academic and industrial conference on Testing - practice and research techniques
Software-defect localisation by mining dataflow-enabled call graphs
ECML PKDD'10 Proceedings of the 2010 European conference on Machine learning and knowledge discovery in databases: Part I
Non-parametric statistical fault localization
Journal of Systems and Software
Locating faults using multiple spectra-specific models
Proceedings of the 2011 ACM Symposium on Applied Computing
An algorithm for capturing variables dependences in test suites
Journal of Systems and Software
Inferred dependence coverage to support fault contextualization
ASE '11 Proceedings of the 2011 26th IEEE/ACM International Conference on Automated Software Engineering
A general noise-reduction framework for fault localization of Java programs
Information and Software Technology
Automatically describing software faults
Proceedings of the 2013 9th Joint Meeting on Foundations of Software Engineering
Prevalence of coincidental correctness and mitigation of its impact on fault localization
ACM Transactions on Software Engineering and Methodology (TOSEM)
Generating profile-based signatures for online intrusion and failure detection
Information and Software Technology
Slice-based statistical fault localization
Journal of Systems and Software
HSFal: Effective fault localization using hybrid spectrum of full slices and execution slices
Journal of Systems and Software
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Failures triggered by hard to debug defects usually involve complex interactions between many program elements. This paper hypothesizes that information flows present a good model for such interactions and presents a new fault localization technique based on information flow coverage. Using a test suite, the technique ranks the statements in a program in terms of their likelihood of being faulty by comparing the information flows induced by the failing runs with the ones induced by the passing runs. The ranking of the statements associated with a given flow is primarily determined by contrasting the percentage of failing runs to the percentage of passing runs that induced it. Generally, a higher percentage of failing runs implies a higher rank. To show its potential, the technique was applied to several open-source Java programs and was compared, with respect to its fault localization effectiveness, with three other coverage techniques that use similar style metrics that are defined for statements, branches, and def–use pairs, respectively. The results revealed that information flow, branch, and def–use coverage performed consistently better than statement coverage. In addition, in a considerable number of cases information flow coverage performed better than branch and def–use coverage. Specifically, it was always safer but not always more precise. Copyright © 2009 John Wiley & Sons, Ltd. This paper presents a new fault localization technique based on information flow coverage. The technique was compared to three other coverage techniques that use similar style metrics that are defined for statements, branches and def-use pairs, respectively. The results revealed that information flow, branch, and def-use coverage performed consistently better than statement coverage, and in a considerable number of cases information flow coverage performed better than branch and def-use coverage. Specifically, it was always safer but not always more precise. Copyright © 2009 John Wiley & Sons, Ltd.