PIE: A Dynamic Failure-Based Technique
IEEE Transactions on Software Engineering
Debugging with dynamic slicing and backtracking
Software—Practice & Experience
The dynamic domain reduction procedure for test data generation
Software—Practice & Experience
Yesterday, my program worked. Today, it does not. Why?
ESEC/FSE-7 Proceedings of the 7th European software engineering conference held jointly with the 7th ACM SIGSOFT international symposium on Foundations of software engineering
Coverage criteria for GUI testing
Proceedings of the 8th European software engineering conference held jointly with 9th ACM SIGSOFT international symposium on Foundations of software engineering
Isolating cause-effect chains from computer programs
Proceedings of the 10th ACM SIGSOFT symposium on Foundations of software engineering
ISSRE '02 Proceedings of the 13th International Symposium on Software Reliability Engineering
Automatic test data generation
Automatic test data generation
A comprehensive framework for testing graphical user interfaces
A comprehensive framework for testing graphical user interfaces
Scalable statistical bug isolation
Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation
Studying the Fault-Detection Effectiveness of GUI Test Cases for Rapidly Evolving Software
IEEE Transactions on Software Engineering
Locating faulty code using failure-inducing chops
Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering
Empirical evaluation of the tarantula automatic fault-localization technique
Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering
Automated path generation for software fault localization
Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering
Improving test suites for efficient fault localization
Proceedings of the 28th international conference on Software engineering
Locating faults through automated predicate switching
Proceedings of the 28th international conference on Software engineering
An Approach to Test Data Generation for Killing Multiple Mutants
ICSM '06 Proceedings of the 22nd IEEE International Conference on Software Maintenance
On the Use of Mutation Faults in Empirical Assessments of Test Case Prioritization Techniques
IEEE Transactions on Software Engineering
Statistical Debugging: A Hypothesis Testing-Based Approach
IEEE Transactions on Software Engineering
Proceedings of the 2007 international symposium on Software testing and analysis
Locating faulty code by multiple points slicing
Software—Practice & Experience
Automatic mutation test input data generation via ant colony
Proceedings of the 9th annual conference on Genetic and evolutionary computation
An empirical study of the effects of test-suite reduction on fault localization
Proceedings of the 30th international conference on Software engineering
Fault localization using value replacement
ISSTA '08 Proceedings of the 2008 international symposium on Software testing and analysis
Using an RBF Neural Network to Locate Program Bugs
ISSRE '08 Proceedings of the 2008 19th International Symposium on Software Reliability Engineering
Mutation Operators for Spreadsheets
IEEE Transactions on Software Engineering
An empirical study of the factors that reduce the effectiveness of coverage-based fault localization
Proceedings of the 2nd International Workshop on Defects in Large Software Systems: Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009)
Information and Software Technology
A practical evaluation of spectrum-based fault localization
Journal of Systems and Software
Test-Suite Augmentation for Evolving Software
ASE '08 Proceedings of the 2008 23rd IEEE/ACM International Conference on Automated Software Engineering
Fault localization through evaluation sequences
Journal of Systems and Software
Generating Event Sequence-Based Test Cases Using GUI Runtime State Feedback
IEEE Transactions on Software Engineering
Iterative execution-feedback model-directed GUI testing
Information and Software Technology
Practical fault localization for dynamic web applications
Proceedings of the 32nd ACM/IEEE International Conference on Software Engineering - Volume 1
Cleansing Test Suites from Coincidental Correctness to Enhance Fault-Localization
ICST '10 Proceedings of the 2010 Third International Conference on Software Testing, Verification and Validation
Mutation-driven generation of unit tests and oracles
Proceedings of the 19th international symposium on Software testing and analysis
Directed test suite augmentation: techniques and tradeoffs
Proceedings of the eighteenth ACM SIGSOFT international symposium on Foundations of software engineering
Are automated debugging techniques actually helping programmers?
Proceedings of the 2011 International Symposium on Software Testing and Analysis
On the influence of multiple faults on coverage-based fault localization
Proceedings of the 2011 International Symposium on Software Testing and Analysis
Strong higher order mutation-based test data generation
Proceedings of the 19th ACM SIGSOFT symposium and the 13th European conference on Foundations of software engineering
GUI Interaction Testing: Incorporating Event Context
IEEE Transactions on Software Engineering
An Analysis and Survey of the Development of Mutation Testing
IEEE Transactions on Software Engineering
GUI Software Fault Localization Using N-gram Analysis
HASE '11 Proceedings of the 2011 IEEE 13th International Symposium on High-Assurance Systems Engineering
Fault Localization for Dynamic Web Applications
IEEE Transactions on Software Engineering
How well does test case prioritization integrate with statistical fault localization?
Information and Software Technology
Mutation based test case generation via a path selection strategy
Information and Software Technology
IEEE Transactions on Software Engineering
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Context: Fault localization lies at the heart of program debugging and often proceeds by contrasting the statistics of program constructs executed by passing and failing test cases. A vital issue here is how to obtain these ''suitable'' test cases. Techniques presented in the literature mostly assume the existence of a large test suite a priori. However, developers often encounter situations where a failure occurs, but where no or no appropriate test suite is available for use to localize the fault. Objective: This paper aims to alleviate this key limitation of traditional fault localization techniques for GUI software particularly, namely, it aims at enabling cost-effective fault localization process for GUI software in the described scenario. Method: To address this scenario, we propose a mutation-oriented test data augmentation technique, which actually is directed by the ''similarity'' criterion in GUI software's test case context towards the generation of test suite with excellent fault localization capabilities. More specifically, the technique mainly uses four proposed novel mutation operators to iteratively mutate some failing GUI test cases' event sequences to derive new test cases potentially useful to localize the specific encountered fault. We then compare the fault localization performance of the test suite generated using this technique with that of an original provided large event-pair adequate test suite on some GUI applications. Results: The results indicate that the proposed technique is capable of generating a test suite that has comparable, if not better, fault localization effectiveness to the event-pair adequate test suite, but it is much smaller and it is generated immediately once a failure is encountered by developers. Conclusion: It is concluded that the proposed technique can truly enable quick-start cost-effective fault localization process under the investigated all-too-common scenario, greatly alleviating one key limitation of traditional fault localization techniques and prompting the test-diagnose-repair cycle.