An Analysis and Survey of the Development of Mutation Testing

Authors:
Yue Jia;Mark Harman
Affiliations:
University College London, London;University College London, London
Venue:
IEEE Transactions on Software Engineering
Year:
2011

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Abstract

Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has contributed a set of approaches, tools, developments, and empirical results. This paper provides a comprehensive analysis and survey of Mutation Testing. The paper also presents the results of several development trend analyses. These analyses provide evidence that Mutation Testing techniques and tools are reaching a state of maturity and applicability, while the topic of Mutation Testing itself is the subject of increasing interest.