Test-case generation for embedded simulink via formal concept analysis

  • Authors:
  • Nannan He;Philipp Rümmer;Daniel Kroening

  • Affiliations:
  • Oxford University;Uppsala University;Oxford University

  • Venue:
  • Proceedings of the 48th Design Automation Conference
  • Year:
  • 2011

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Abstract

Mutation testing suffers from the high computational cost of automated test-vector generation, due to the large number of mutants that can be derived from programs and the cost of generating test-cases in a white-box manner. We propose a novel algorithm for mutation-based test-case generation for Simulink models that combines white-box testing with formal concept analysis. By exploiting similarity measures on mutants, we are able to effectively generate small sets of short test-cases that achieve high coverage on a collection of Simulink models from the automotive domain. Experiments show that our algorithm performs significantly better than random testing or simpler mutation-testing approaches.