Data-driven testing methodology for RFID systems

Authors:
An Lu;Wenbin Fang;Chang Xu;Shing-Chi Cheung;Yu Liu
Affiliations:
Department of Computer Science and Engineering, The Hong Kong University of Science and Technology, Hong Kong, China;Department of Computer Science and Engineering, The Hong Kong University of Science and Technology, Hong Kong, China;Department of Computer Science and Engineering, The Hong Kong University of Science and Technology, Hong Kong, China and Department of Computer Science and Technology, Nanjing University, Nanjing, ...;Department of Computer Science and Engineering, The Hong Kong University of Science and Technology, Hong Kong, China;Institute of Automation, Chinese Academy of Sciences, Beijing, China 100190
Venue:
Frontiers of Computer Science in China
Year:
2010

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Abstract

A radio-frequency identification (RFID) system including hardware and software may be updated from time to time after first time deployment. To ensure the reliability of the system, extensive tests are required. However, enumerating all test cases is infeasible, especially when the tests involve time-consuming hardware operations. To solve this problem, we propose a testing methodology for RFID systems which does not enumerate all test cases but rather those which are representative. A clustering method is adopted in selecting representative test cases. Although a small number of selected test cases are run, we can still obtain a relatively high bug detection rate compared with running the enumerated test cases. Our extensive experiments show the efficiency and effectiveness of our testing methodology.