(Un-)Covering Equivalent Mutants
ICST '10 Proceedings of the 2010 Third International Conference on Software Testing, Verification and Validation
Functional qualification of TLM verification
Proceedings of the Conference on Design, Automation and Test in Europe
An Analysis and Survey of the Development of Mutation Testing
IEEE Transactions on Software Engineering
OCCOM-efficient computation of observability-based code coverage metrics for functional verification
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Coverage discounting: A generalized approach for testbench qualification
HLDVT '11 Proceedings of the 2011 IEEE International High Level Design Validation and Test Workshop
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Mutation testing is an established technique for evaluating validation thoroughness, but its adoption has been limited by the manual effort required to analyze the results. This paper describes the use of coverage discounting for mutation analysis, where undetected mutants are explained in terms of functional coverpoints, simplifying their analysis and saving effort. Two benchmarks are shown to compare this improved flow against regular mutation analysis. We also propose a confidence metric and simulation ordering algorithm optimized for coverage discounting, potentially reducing overall simulation time.