Wrappers for feature subset selection
Artificial Intelligence - Special issue on relevance
An introduction to support Vector Machines: and other kernel-based learning methods
An introduction to support Vector Machines: and other kernel-based learning methods
Performance sensitivity analysis using statistical method and its applications to delay
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
Proceedings of the 39th annual Design Automation Conference
T4: New Validation and Test Problems for High Performance Deep Submicron VLSI Circuits
VLSID '00 Proceedings of the 13th International Conference on VLSI Design
Delay Defect Diagnosis Based Upon Statistical Timing Models " The First Step
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
On path-based learning and its applications in delay test and diagnosis
Proceedings of the 41st annual Design Automation Conference
A path-based methodology for post-silicon timing validation
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
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This paper presents a novel path-based learning methodology to achieve timing Regression Simulation. The methodology can be applied for two purposes: (1) In pre-silicon phase, regression simulation can be used to produce a fast and approximate timing simulator to avoid the high cost associated with statistical timing simulation. (2) In post-silicon phase, regression simulation can be used as a vehicle to deduce critical paths from the pass/fail behavior observed on the test chips. Our path-based learning methodology consists of four major components: a delay test pattern set, a logic simulator, a set of selected paths as the basis for learning, and a machine learner. We summarize the key concepts in our regression simulation approach and present experimental results.