Switch-level bridging fault simulation in the presence of feedbacks
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Delay Testing Considering Power Supply Noise Effects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Regression Simulation: Applying Path-Based Learning In Delay Test and Post-Silicon Validation
Proceedings of the conference on Design, automation and test in Europe - Volume 1
On path-based learning and its applications in delay test and diagnosis
Proceedings of the 41st annual Design Automation Conference
Re-synthesis for delay variation tolerance
Proceedings of the 41st annual Design Automation Conference
A path-based methodology for post-silicon timing validation
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Experience in critical path selection for deep sub-micron delay test and timing validation
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Post-silicon bug detection for variation induced electrical bugs
Proceedings of the 16th Asia and South Pacific Design Automation Conference
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