Integrating Functional and Temporal Domains in Logic Design: The False Path Problem and Its Implications
A Systematic Approach for Diagnosing Multiple Delay Faults
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
A fault diagnosis methodology for the UltraSPARC/sup TM/-I microprocessor
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Fault diagnosis based on effect-cause analysis: An introduction
DAC '80 Proceedings of the 17th Design Automation Conference
On Diagnosing Path Delay Faults in an At-Speed Environment
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
Multiple Fault Diagnosis Using n-Detection Tests
ICCD '03 Proceedings of the 21st International Conference on Computer Design
An Adaptive Path Delay Fault Diagnosis Methodology
ISQED '04 Proceedings of the 5th International Symposium on Quality Electronic Design
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Statistical Clock Skew Analysis Considering Intra-Die Process Variations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Delay Defect Diagnosis Based Upon Statistical Timing Models " The First Step
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Propagation delay fault: a new fault model to test delay faults
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
IEEE Design & Test
Delay-fault diagnosis using timing information
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Timing-aware multiple-delay-fault diagnosis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. The existing delay-fault diagnosis algorithms cannot identify the delay faults that require nonrobust tests, because they ignore non-robust propagation conditions while emulating the failure analyzer's behavior. We propose a novel approach to perform delay-fault diagnosis for robust and non-robust tests. The experimental results show that our approach can diagnose delay faults with good resolution. It is stable with respect to delay variations that the failure analyzer might experience.