Multiple-Output Propagation Transition Fault Test
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Diagnosing multiple transition faults in the absence of timing information
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Delay Fault Diagnosis for Non-Robust Test
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Diagnosis framework for locating failed segments of path delay faults
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Timing-aware multiple-delay-fault diagnosis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Recent techniques for path delay fault diagnosis have addressed the problem in combinational circuits and sequential circuits. The root cause of a path delay fault test failure is narrowed down to a set of functionally sensitized paths and this set is further reduced by post processing the set of passing tests. In this paper, we present a method for narrowing down the suspects further to a set of segments on the failing functionally sensitized paths. The proposed method is implemented and applied to a set of industrial circuits and it is found to be very effective in determining the defective segments that explain excessive delays along paths.