Diagnosing multiple transition faults in the absence of timing information

Authors:
Jiang Brandon Liu;Magdy Abadir;Andreas Veneris;Sean Safarpour
Affiliations:
High Perf. Tools and Meth. Freescale Semiconductor, Austin, TX;High Perf. Tools and Meth. Freescale Semiconductor, Austin, TX;University of Toronto, Toronto, ON;University of Toronto, Toronto, ON
Venue:
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Year:
2005

Citing 8
Cited 1

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Abstract

As timing requirements in today's advanced VLSI designs become more aggressive, the need for automated tools to diagnose timing failures increases. This work presents two such algorithms capable of diagnosing multiple delay faults. One method uses multiple transition fault models and the other reasons with ternary logic values, thus achieving model independent diagnosis. Experiments are conducted on IS-CAS'85 combinational and full-scan version of ISCAS'89 se-quential circuits corrupted with multiple transition faults. The performance of both algorithms are evaluated and compared. The results show good efficiency and diagnostic resolution.