A Systematic Approach for Diagnosing Multiple Delay Faults

Authors:
Jayabrata Ghosh-Dastidar;Nur A. Touba
Affiliations:
-;-
Venue:
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
Year:
1998

Citing 0
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Abstract

In the presence of multiple delay faults, automated diagnostic procedures that make a single fault assumption may give an incorrect diagnosis. In this paper, a systematic approach is proposed for delay fault diagnosis under a multiple fault assumption. Information from the failing test vectors are used to construct a list of single and multiple fault suspects that may have caused all of the observed faulty response. The list of suspects is then pruned and ranked in a novel way by using information from the passing test vectors combined with static timing information.