Incremental Diagnosis and Correction of Multiple Faults and Errors

Authors:
A. Veneris;J. Liu;M. Amiri;M. Abadir
Affiliations:
University of Toronto, Department of ECE, Toronto, ON;University of Toronto, Department of ECE, Toronto, ON;University of Toronto, Department of ECE, Toronto, ON;Motorola, 7700 W. Parmer, Austin, TX
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2002

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Abstract

An incremental simulation-based approach to fault diagnosisand logic debugging is presented. During each iterationof the algorithm, a single suspicious location is identifiedand fault modeled such that the functionality of the newdesign becomes "closer" to its specification. The methodis based on a simple and, at a first glance, counter-intuitivetheoretical result along with a number of heuristics whichhelp avoid the exponential complexity inherent to the problems.Experiments on multiple design errors and multiplestuck-at faults confirm its effectiveness and accuracy, whichscales well with increasing number of errors.