Diagnosing multiple transition faults in the absence of timing information
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
On the relation between simulation-based and SAT-based diagnosis
Proceedings of the conference on Design, automation and test in Europe: Proceedings
The day Sherlock Holmes decided to do EDA
Proceedings of the 46th Annual Design Automation Conference
Diagnosis of multiple arbitrary faults with mask and reinforcement effect
Proceedings of the Conference on Design, Automation and Test in Europe
An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis
Journal of Electronic Testing: Theory and Applications
DiSC: a new diagnosis method for multiple scan chain failures
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Extraction error modeling and automated model debugging in high-performance custom designs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Diagnosis of transition fault clusters
Proceedings of the 48th Design Automation Conference
On candidate fault sets for fault diagnosis and dominance graphs of equivalence classes
Proceedings of the Conference on Design, Automation and Test in Europe
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Fault diagnosis is important in improving the circuit-design process and the manufacturing yield. Diagnosis of today's complex defects is a challenging problem due to the explosion of the underlying solution space with the increasing number of fault locations and fault models. To tackle this complexity, an incremental diagnosis method is proposed. This method captures faulty lines one at a time using the novel linear-time single-fault diagnosis algorithms. To capture complex fault effects, a model-free incremental diagnosis algorithm is outlined, which alleviates the need for an explicit fault model. To demonstrate the applicability of the proposed method, experiments on multiple stuck-at faults, open-interconnects and bridging faults are performed. Extensive results on combinational and full-scan sequential benchmark circuits confirm its resolution and performance.