Delay Fault Diagnosis for Non-Robust Test
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Test Generation for Model-Based Diagnosis
Proceedings of the 2008 conference on ECAI 2008: 18th European Conference on Artificial Intelligence
Timing-aware multiple-delay-fault diagnosis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Selection of a fault model for fault diagnosis based on unique responses
Proceedings of the Conference on Design, Automation and Test in Europe
Selection of a fault model for fault diagnosis based on unique responses
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Diagnosis of transition fault clusters
Proceedings of the 48th Design Automation Conference
On candidate fault sets for fault diagnosis and dominance graphs of equivalence classes
Proceedings of the Conference on Design, Automation and Test in Europe
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
| Hi-index | 0.00 |
In this paper, we study the relationship between multiple faultdiagnosability and fault detection count. Instead of developing acomplex diagnostic algorithm for multiplefault behavior, we changethe test sets used in test and diagnosis. This allows us to apply asimple single-fault based diagnostic algorithm, and yet achievevery good diagnosability for the failure test cases caused bymultiple faults. We have verified experimentally the effectivenessof n-detection tests for multiple-fault cases and explained theresults in probabilistic terms.