An introduction to support Vector Machines: and other kernel-based learning methods
An introduction to support Vector Machines: and other kernel-based learning methods
Test structures for delay variability
Proceedings of the 8th ACM/IEEE international workshop on Timing issues in the specification and synthesis of digital systems
Fault diagnosis based on effect-cause analysis: An introduction
DAC '80 Proceedings of the 17th Design Automation Conference
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Delay Defect Diagnosis Based Upon Statistical Timing Models " The First Step
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
On Silicon-Based Speed Path Identification
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
Refined statistical static timing analysis through
Proceedings of the 43rd annual Design Automation Conference
Speedpath prediction based on learning from a small set of examples
Proceedings of the 45th annual Design Automation Conference
Statistical diagnosis of unmodeled systematic timing effects
Proceedings of the 45th annual Design Automation Conference
Silicon feedback to improve frequency of high-performance microprocessors: an overview
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Synthesizing a representative critical path for post-silicon delay prediction
Proceedings of the 2009 international symposium on Physical design
A framework for scalable postsilicon statistical delay prediction under process variations
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A statistical diagnosis approach for analyzing design-silicon timing mismatch
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Capturing post-silicon variations using a representative critical path
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Data mining in design and test processes: basic principles and promises
Proceedings of the 2013 ACM international symposium on International symposium on physical design
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In the post-silicon stage, timing information can be extracted from two sources: (1) on-chip monitors and (2) delay testing. In the past, delay test data has been overlooked in the correlation study. In this paper, we take path delay testing as an example to illustrate how test data can be incorporated in the overall design-silicon correlation effort. We describe a path-based methodology that correlates measured path delays from the good chips, to the path delays predicted by timing analysis. We discuss how statistical data mining can be employed for extracting information and show experimental results to demonstrate the potential of the proposed methodology.