Diagnostic reasoning based on structure and behavior
Artificial Intelligence - Special volume on qualitative reasoning about physical systems
A Partial Scan Method for Sequential Circuits with Feedback
IEEE Transactions on Computers
An analytical approach to the partial scan problem
Journal of Electronic Testing: Theory and Applications
On the generation of small dictionaries for fault location
ICCAD '92 1992 IEEE/ACM international conference proceedings on Computer-aided design
Fault dictionary compaction by output sequence removal
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Failure Diagnosis of Structured VLSI
IEEE Design & Test
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Diagnostic Fault Simulation of Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Full fault dictionary storage based on labeled tree encoding
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Dynamic diagnosis of sequential circuits based on stuck-at faults
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Partial scan design based on circuit state information
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Integrated fault diagnosis targeting reduced simulation
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
A diagnostic test generation procedure for synchronous sequential circuits based on test elimination
ITC '98 Proceedings of the 1998 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Estimation of multiple faults in aircraft gas-turbine engines
ACC'09 Proceedings of the 2009 conference on American Control Conference
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Repeated fault diagnosis on large integrated circuits may often be computationally prohibitive due to expensive fault simulation requirements. Fault dictionaries can help alleviate this problem, but they may be infeasible to store because of their large sizes, and more importantly, they typically provide only a black box view of the circuit and hence almost no diagnostic flexibility. The problem occurs because dictionaries usually only store primary output information. A new approach to fault diagnosis based on state information is presented. The selective storage of state information is shown to significantly improve the time for diagnostic fault simulation. We also describe a method to reduce the amount of information stored by choosing only a subset of the state space. This approach is shown to be ideally suited for partial scan circuits whose simple structure is exploited to reduce storage requirements. Experiments on the ISCAS 89 benchmark circuits are performed to demonstrate the efficiency of the state information based diagnosis technique.