Integrated fault diagnosis targeting reduced simulation

Authors:
Vamsi Boppana;W. Kent Fuchs
Affiliations:
Coordinated Science Laboratory, University of Illinois, Urbana, IL;School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN
Venue:
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Year:
1997

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Abstract

Integrated fault diagnosis techniques attempt to overcome the limitations associated with static (pre-computed information usage) and dynamic (run-time analysis) techniques by using a limited amount of pre-computed information and coupling this with simulation at diagnosis time, for rapid fault diagnosis. A significant problem with previous integrated techniques is that the pre-computed information is not targeted specifically toward reducing the run-time costs. We present a new approach to integrated fault diagnosis, by specifically creating the precomputed information to provide later savings in the simulation costs at diagnosis time. Experimental results on the ISCAS 85 and ISCAS 89 circuits illustrate the savings achieved by this technique.