Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
On the generation of small dictionaries for fault location
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
On adaptive diagnostic test generation
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Fault diagnosis using state information
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Using fault sampling to compute I/sub DDQ/ diagnostic test sets
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Techniques to Encode and Compress Fault Dictionaries
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Theory and application of cellular automata for pattern classification
Fundamenta Informaticae - Special issue on cellular automata
Efficient RT-level fault diagnosis methodology
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
An Efficient Dictionary Organization for Maximum Diagnosis
Journal of Electronic Testing: Theory and Applications
Efficient RT-level fault diagnosis
Journal of Computer Science and Technology
Embedded fault diagnosis in digital systems with BIST
Microprocessors & Microsystems
Reducing fault dictionary size for million-gate large circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Diagnostic Test Set Minimization and Full-Response Fault Dictionary
Journal of Electronic Testing: Theory and Applications
Theory and Application of Cellular Automata For Pattern Classification
Fundamenta Informaticae - Cellular Automata
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Fault dictionary compaction has been accomplished in the past by removing responses on individual output pins for specific test vectors. In contrast to the previous work, we present techniques for eliminating entire sequences of outputs and for efficiently storing the remaining output sequences. Experimental results on the ISCAS 85 and ISCAS 89 benchmark circuits show that the sizes of dictionaries proposed are substantially smaller than the full fault dictionary, while the dictionaries retain most or all of the diagnostic capability of the full fault dictionary.