On the generation of small dictionaries for fault location
ICCAD '92 1992 IEEE/ACM international conference proceedings on Computer-aided design
Fault dictionary compaction by output sequence removal
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Fault dictionary compression and equivalence class computation for sequential circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Full fault dictionary storage based on labeled tree encoding
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Approximation algorithms for combinatorial problems
Journal of Computer and System Sciences
Compact Dictionaries for Fault Diagnosis in Scan-BIST
IEEE Transactions on Computers
Improve the Quality of Per-Test Fault Diagnosis Using Output Information
Journal of Electronic Testing: Theory and Applications
Design and analysis of compact dictionaries for diagnosis in scan-BIST
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Dictionary encoding schemes have not addressed the cost of reconstructing the dictionary during fault location. We show that by modifying a previously proposed dictionary encoding scheme only small portions of the information need be reconstructed during fault location. This provides a mechanism to reduce the number of secondary accesses during fault location.For pass-fail dictionaries, we present a simplified encoding scheme that reduces both the secondary storage requirement as well as the number of secondary accesses. A novel dictionary structure, known as hybrid dictionaries, which retains the full resolution with respect to modeled faults is presented. Heuristics to compute such dictionaries, its usefulness and how such dictionaries can be encoded for quick information retrieval are discussed.