Diagnosis of leakage faults with IDDQ
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Failure Diagnosis of Structured VLSI
IEEE Design & Test
Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Test Generation and Design for Test for a Large Multiprocessing DSP
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Shmoo Plots - the Black Art of IC Test
Proceedings of the IEEE International Test Conference on Test and Design Validity
Beyond the Byzantine Generals: Unexpected Behaviour and Bridging Fault Diagnosis
Proceedings of the IEEE International Test Conference on Test and Design Validity
Diagnostic Fault Simulation of Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Diagnostic techniques for the UltraSPARC microprocessors
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Logic Mapping on a Microprocessor
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Electronic Process Limited Yield
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
Expediting Ramp-to-Volume Production
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Towards Reducing "Functional Only" Fails for the UltraSPARCTM Microprocessors
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Correlation of Logical Failures to a Suspect Process Step
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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In order to meet market demands for the rapid introduction of new semiconductor products, automated means of diagnosing defective silicon are fast becoming a requirement. The use of these techniques affects many parts of the product design and manufacturing processes. This paper describes the development and deployment of an automated diagnosis methodology within Texas Instruments.