Automated Diagnosis in Testing and Failure Analysis
IEEE Design & Test
Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Logic Mapping on a Microprocessor
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Expediting Ramp-to-Volume Production
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Towards Reducing "Functional Only" Fails for the UltraSPARCTM Microprocessors
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Correlation of Logical Failures to a Suspect Process Step
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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Successful manufacturing ramp of a complex high speedmicroprocessor requires quick and reliable test anddiagnostic methods. Some commonly used debugtechniques for the UltraSPARC family of devices arepresented with actual result of some diagnosed failures.