Beyond the Byzantine Generals: Unexpected Behaviour and Bridging Fault Diagnosis

A deductive technique for diagnosis of bridging faults

ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design

Bridging Faults in Pipelined Circuits

Journal of Electronic Testing: Theory and Applications

Automated Diagnosis in Testing and Failure Analysis

IEEE Design & Test

Modeling the Unmodelable: Algorithmic Fault Diagnosis

IEEE Design & Test

Poirot: Applications of a Logic Fault Diagnosis Tool

IEEE Design & Test

A Symbolic Inject-and-Evaluate Paradigm for Byzantine Fault Diagnosis

Journal of Electronic Testing: Theory and Applications

On applying non-classical defect models to automated diagnosis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Modeling the unknown! Towards model-independent fault and error diagnosis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Probabilistic mixed-model fault diagnosis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Computer-Aided Fault to Defect Mapping (CAFDM) for Defect Diagnosis

ITC '00 Proceedings of the 2000 IEEE International Test Conference

POIROT1: A Logic Fault Diagnosis Tool and Its Applications

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Diagnosing Combinational Logic Designs Using the Single Location At-a-Time (SLAT) Paradigm

ITC '01 Proceedings of the 2001 IEEE International Test Conference

FAULT MODEL EXTENSION FOR DIAGNOSING CUSTOM CELL FAILS

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Bridging Fault Diagnosis in the Absence of Physical Information

ITC '97 Proceedings of the 1997 IEEE International Test Conference

DIAGNOSIS OF BRIDGING FAULTS IN SEQUENTIAL CIRCUITS USING ADAPTIVE SIMULATION, STATE STORAGE, AND PATH-TRACING

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Expediting Ramp-to-Volume Production

ITC '99 Proceedings of the 1999 IEEE International Test Conference

On per-test fault diagnosis using the X-fault model

Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design

Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults

Journal of Electronic Testing: Theory and Applications

Fault diagnosis of physical defects using unknown behavior model

Journal of Computer Science and Technology

A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits

IEICE - Transactions on Information and Systems

Parallel X-fault simulation with critical path tracing technique

Proceedings of the Conference on Design, Automation and Test in Europe

Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits

Journal of Electronic Testing: Theory and Applications