On per-test fault diagnosis using the X-fault model

Authors:
Xiaoqing Wen;Tokiharu Miyoshi;Seiji Kajihara;Laung-Terng Wang;K. K. Saluja;K. Kinoshita
Affiliations:
Dept. of Comput. Sci. & Eng., Kyushu Inst. of Technol., Iizuka, Japan;Dept. of Comput. Sci. & Eng., Kyushu Inst. of Technol., Iizuka, Japan;Dept. of Comput. Sci. & Eng., Kyushu Inst. of Technol., Iizuka, Japan;SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, Sunnyvale, CA;Dept. ofECE, 1415 Engineering Drive, University of Wisconsin - Madison, Madison, WI;Faculty of Infonnatics, Osaka Gakuin University, Suita 564-8511, Japan
Venue:
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Year:
2004

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Abstract

This work proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model represents all possible behaviors of a physical defect or defects in a gate and/or on its fanout branches by using different X symbols on the fanout branches. A novel technique is proposed for analyzing the relation between observed and simulated responses to extract diagnostic information and to score the results of diagnosis. Experimental results show the effectiveness of our method.