Post-BIST Fault Diagnosis for Multiple Faults

Authors:
Hiroshi Takahashi;Yoshinobu Higami;Shuhei Kadoyama;Yuzo Takamatsu;Koji Yamazaki;Takashi Aikyo;Yasuo Sato
Affiliations:
-;-;-;-;-;-;-
Venue:
IEICE - Transactions on Information and Systems
Year:
2008

Citing 5
Cited 0

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Effective Post-BIST Fault Diagnosis for Multiple Faults

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Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment

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Abstract

With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis [1]. In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed.