BIST Based Fault Diagnosis Using Ambiguous Test Set

  • Authors:

  • Hiroshi Takahashi;Yasunori Tsugaoka;Hidekazu Ayano;Yuzo Takamatsu

  • Affiliations:

  • -;-;-;-

  • Venue:
  • DFT '03 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
  • Year:
  • 2003

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Abstract

We propose a method for diagnosing single stuck-at faults under Built-In Self-Test (BIST) environment. Under BIST environment, it is di.cult to determine which BIST vectors producederrors due to the high degree of test response compaction. Therefore the detecting test set that is determined in BIST session includes un-detecting tests. We call the detecting test set determined after BIST session an "ambiguous diagnostic test set". First, we propose a method for identifying candidate faults based on the ambiguous diagnostic test set. Moreover we propose a method for identifying candidate un-detecting tests that belong to the ambiguous diagnostic test set. Diagnosis by using more accurate diagnostic test set is able to improve the diagnostic ambiguity.