Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis
ITC '02 Proceedings of the 2002 IEEE International Test Conference
A Persistent Diagnostic Technique for Unstable Defects
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Fault Diagnosis in Scan-Based BIST Using Both Time and Space Information
ITC '99 Proceedings of the 1999 IEEE International Test Conference
On per-test fault diagnosis using the X-fault model
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In general, we do not know which fault model can explain the cause of the faulty values at the primary outputs in a circuit under test before starting diagnosis. Moreover, under Built-In Self Test (BIST) environment, it is difficult to know which primary output has a faulty value on the application of a failing test pattern. In this paper, we propose an effective diagnosis method on multiple fault models, based on only pass/fail information on the applied test patterns. The proposed method deduces both the fault model and the fault location based on the number of detections for the single stuck-at fault at each line, by performing single stuck-at fault simulation with both passing and failing test patterns. To improve the ability of fault diagnosis, our method uses the logic values of lines and the condition whether the stuck-at faults at the lines are detected or not by passing and failing test patterns. Experimental results show that our method can accurately identify the fault models (stuck-at fault model, AND/OR bridging fault model, dominance bridging fault model, or open fault model) for 90% faulty circuits and that the faulty sites are located within two candidate faults.