Exclusive Test and its Applications to Fault Diagnosis
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
On per-test fault diagnosis using the X-fault model
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
An Efficient Dictionary Organization for Maximum Diagnosis
Journal of Electronic Testing: Theory and Applications
Multiple defect diagnosis using no assumptions on failing pattern characteristics
Proceedings of the 45th annual Design Automation Conference
IEICE - Transactions on Information and Systems
Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
IEICE - Transactions on Information and Systems
Diagnosis of integrated circuits with multiple defects of arbitrary characteristics
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Special issue on the 2009 ACM/IEEE international symposium on networks-on-chip
Diagnosis of multiple arbitrary faults with mask and reinforcement effect
Proceedings of the Conference on Design, Automation and Test in Europe
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Diagnosing multiple stuck-at faults in combinational circuits using singleand multiple-fault simulation is proposed. The proposed method adds (removes) faults from a set of suspected faults depending on the result of multiple-fault simulation at a primary output agreeing (disagreeing) with the observed value. However, the faults that are added or removed from the set of suspected faults are determined using single-fault simulation. Diagnosis is carried out by repeated addition and removal of faults. The effectiveness of the diagnosis method is evaluated by experiments conducted on benchmark circuits and it is found to be substantially superior compared to the previous known solutions. The method proposed in this paper can be used as a powerful tool at the preprocessing stage of diagnosis in an electron-beam tester environment