A deductive technique for diagnosis of bridging faults
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Multiple error diagnosis based on xlists
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm
Proceedings of the IEEE International Test Conference 2001
On efficient error diagnosis of digital circuits
Proceedings of the IEEE International Test Conference 2001
Error Diagnosis of Sequential Circuits Using Region-Based Model
VLSID '01 Proceedings of the The 14th International Conference on VLSI Design (VLSID '01)
Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis
Proceedings of the conference on Design, automation and test in Europe - Volume 1
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Diagnosing arbitrary defects in logic designs using single location at a time (SLAT)
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Analysis and methodology for multiple-fault diagnosis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Multiple-Fault Diagnosis Based On Adaptive Diagnostic Test Pattern Generation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Diagnosis of integrated circuits with multiple defects of arbitrary characteristics
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Special issue on the 2009 ACM/IEEE international symposium on networks-on-chip
An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis
Journal of Electronic Testing: Theory and Applications
Diagnosis of transition fault clusters
Proceedings of the 48th Design Automation Conference
On candidate fault sets for fault diagnosis and dominance graphs of equivalence classes
Proceedings of the Conference on Design, Automation and Test in Europe
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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We propose an effective multiple defect diagnosis methodology that does not depend on failing pattern characteristics. The methodology consists of a conservative defect site identification and elimination algorithm, and an innovative path-based defect site elimination technique. The search space of the diagnosis method does not grow exponentially with the number of defects in the circuit under diagnosis. Simulation experiments show that this method can effectively diagnose circuits that are affected by 10 or more faults that include multiple stuck-at, bridge and transistor stuck-open faults.