Exclusive Test and its Applications to Fault Diagnosis
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Incremental Design Debugging in a Logic Synthesis Environment
Journal of Electronic Testing: Theory and Applications
Multiple defect diagnosis using no assumptions on failing pattern characteristics
Proceedings of the 45th annual Design Automation Conference
Accurate rank ordering of error candidates for efficient HDL design debugging
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Diagnosis of integrated circuits with multiple defects of arbitrary characteristics
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Special issue on the 2009 ACM/IEEE international symposium on networks-on-chip
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