Location of Stuck-At Faults and Bridging Faults Based on Circuit Partitioning
IEEE Transactions on Computers
Logic Design Validation via Simulation and Automatic Test Pattern Generation
Journal of Electronic Testing: Theory and Applications
System Test and Diagnosis
Poirot: Applications of a Logic Fault Diagnosis Tool
IEEE Design & Test
Parity-Scan Design to Reduce the Cost of Test Application
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Diagnostic Fault Simulation of Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
On efficient error diagnosis of digital circuits
Proceedings of the IEEE International Test Conference 2001
Multiple Faults: Modeling, Simulation and Test
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Implication and Evaluation Techniques for Proving Fault Equivalence
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A New Algorithm for Global Fault Collapsing into Equivalence and Dominance Sets
ITC '02 Proceedings of the 2002 IEEE International Test Conference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Accurate Diagnosis of Multiple Faults
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Multiple-fault diagnosis based on single-fault activation and single-output observation
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Fault simulation and test generation for clock delay faults
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Diagnostic Test Set Minimization and Full-Response Fault Dictionary
Journal of Electronic Testing: Theory and Applications
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We introduce a new type of test, called exclusive test,und discuss its application to fault diagnosis in combinational circuits. A test that detects exactly one faultfrom a given pair of faults is called an exclusive test.In general, generation of an exclusive test by a conventional automatic test generator requires a model ofthe circuit with multiple-faults. We describe an ATPGmodel that transforms the exclusive test problem intoa single-fault test generation problem. We present ageneralized diagnostic method and illustrate the use ofexclusive tests in improving the diagnostic resolution ofa test set. Results of diagnosis with exclusive tests forISCAS85 bencmark circuits are included.