Accurate Diagnosis of Multiple Faults

Authors:
Yung-Chieh Lin;Feng Lu;Kwang-Ting Cheng
Affiliations:
Dept. of ECE, University of California, Santa Barbara, Santa Barbara, USA;Dept. of ECE, University of California, Santa Barbara, Santa Barbara, USA;Dept. of ECE, University of California, Santa Barbara, Santa Barbara, USA
Venue:
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Year:
2005

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Abstract

In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective signals which can jointly explain the circuit驴s faulty behavior. This method can be applied after any existing state-of-the-art diagnosis process to further improve the diagnosis resolution. The proposed diagnosis method generates limited-cycle sequential tests for SAT-based diagnosis which results in significantly higher diagnosis accuracy for multiple faults. The experimental results demonstrate the effectiveness of the proposed method.