Accurate Diagnosis of Multiple Faults
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Multiple-fault diagnosis based on single-fault activation and single-output observation
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Multiple defect diagnosis using no assumptions on failing pattern characteristics
Proceedings of the 45th annual Design Automation Conference
Scan chain organization for embedded diagnosis
Proceedings of the conference on Design, automation and test in Europe
Adaptive Debug and Diagnosis Without Fault Dictionaries
Journal of Electronic Testing: Theory and Applications
Diagnosis of multiple arbitrary faults with mask and reinforcement effect
Proceedings of the Conference on Design, Automation and Test in Europe
Automated data analysis solutions to silicon debug
Proceedings of the Conference on Design, Automation and Test in Europe
A diagnosis algorithm for extreme space compaction
Proceedings of the Conference on Design, Automation and Test in Europe
Structural Test and Diagnosis for Graceful Degradation of NoC Switches
Journal of Electronic Testing: Theory and Applications
Automating data analysis and acquisition setup in a silicon debug environment
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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A new form of logic diagnosis is described that is suitable for diagnosing fails in combinational logic. It can diagnose defects that can affect arbitrarily many elements in the integrated circuit. It operates by first identifying patterns during which only one element is affected by the defect, and then diagnosing the fails observed during the application of such patterns, one pattern at a time. Single stuck-at faults are used for this purpose, and the aggregate of stuck-at fault locations thus identified is then further analyzed to obtain the most accurate estimate of the identities of those elements that can be affected by the defect. This approach to logic diagnosis is as effective as that of classical stuck-at fault-based diagnosis, when the latter applies, but is far more general. In particular, it can diagnose fails caused by bridges and opens as well as fails caused by regular stuck-at faults.