ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
FPGA routing and routability estimation via Boolean satisfiability
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
GRASP: A Search Algorithm for Propositional Satisfiability
IEEE Transactions on Computers
Using SAT for combinational equivalence checking
Proceedings of the conference on Design, automation and test in Europe
Towards the logic defect diagnosis for partial-scan designs
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Chaff: engineering an efficient SAT solver
Proceedings of the 38th annual Design Automation Conference
Modeling the Unmodelable: Algorithmic Fault Diagnosis
IEEE Design & Test
Applying SAT Methods in Unbounded Symbolic Model Checking
CAV '02 Proceedings of the 14th International Conference on Computer Aided Verification
Propositional satisfiability algorithms in eda applications
Propositional satisfiability algorithms in eda applications
Testing of Digital Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Managing Don't Cares in Boolean Satisfiability
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Incremental Design Debugging in a Logic Synthesis Environment
Journal of Electronic Testing: Theory and Applications
Accurate Diagnosis of Multiple Faults
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Debugging sequential circuits using Boolean satisfiability
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Automated Source-Level Error Localization in Hardware Designs
IEEE Design & Test
Generation of shorter sequences for high resolution error diagnosis using sequential SAT
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Multiple-fault diagnosis based on single-fault activation and single-output observation
Proceedings of the conference on Design, automation and test in Europe: Proceedings
On the relation between simulation-based and SAT-based diagnosis
Proceedings of the conference on Design, automation and test in Europe: Proceedings
From Error to Error: Logic Debugging in the Many-Core Era
Electronic Notes in Theoretical Computer Science (ENTCS)
Hierarchical diagnosis of multiple faults
IJCAI'07 Proceedings of the 20th international joint conference on Artifical intelligence
Proceedings of the 46th Annual Design Automation Conference
Debugging strategies for mere mortals
Proceedings of the 46th Annual Design Automation Conference
Automatic fault localization for property checking
HVC'06 Proceedings of the 2nd international Haifa verification conference on Hardware and software, verification and testing
Approximate model-based diagnosis using greedy stochastic search
Journal of Artificial Intelligence Research
An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis
Journal of Electronic Testing: Theory and Applications
Automated design debugging with maximum satisfiability
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Facilitating unreachable code diagnosis and debugging
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Substitutional definition of satisfiability in classical propositional logic
SAT'05 Proceedings of the 8th international conference on Theory and Applications of Satisfiability Testing
Automatic test pattern generation
SFM'06 Proceedings of the 6th international conference on Formal Methods for the Design of Computer, Communication, and Software Systems
Intuitive ECO synthesis for high performance circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Multi-patch generation for multi-error logic rectification by interpolation with cofactor reduction
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Microprocessors & Microsystems
Hi-index | 0.00 |
Recent advances in Boolean satisfiability have made it an attractive engine for solving many digital VLSI design problems such as verification, model checking, optimization and test generation. Fault diagnosis and logic debugging have not been addressed by existing satisfiability-based solutions. This paper attempts to bridge this gap by proposing a satisfiability-based solution to these problems. The proposed formulation is intuitive and easy to implement. It shows that satisfiability captures significant problem characateristics and it offers different trade-offs. It also provides new opportunities for satisfiability-based diagnosis tools and diagnosis-specific satisfiability algorithms. Theory and experiments validate the claims and demonstrate its potential.