Design diagnosis using Boolean satisfiability
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
A Minimum Cut Based Re-Synthesis Approach
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Journal of Electronic Testing: Theory and Applications
Debugging sequential circuits using Boolean satisfiability
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Logic verification based on diagnosis techniques
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Signature-based SER analysis and design of logic circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Automated design debugging with abstraction and refinement
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Sequential logic rectifications with approximate SPFDs
Proceedings of the Conference on Design, Automation and Test in Europe
Automating data analysis and acquisition setup in a silicon debug environment
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints such as area, power, or delay. Recently, automated test pattern generation (ATPG)-based design rewiring techniques for technology-dependent logic optimization have gained increasing popularity. In this paper, the authors propose a new operational framework to design rewiring that uses ATPG and diagnosis algorithms. They also examine its complexity requirements and discuss different implementation tradeoffs. To perform this study, the authors reduce the problem of design rewiring to the process of injecting a redundant set of multiple pattern faults. This formulation arrives at a new set of results with theoretical and practical applications. Experiments demonstrate the competitiveness of the approach and motivate future work in the area.