Exclusive Test and its Applications to Fault Diagnosis
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Level of Similarity: A Metric for Fault Collapsing
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Diagnostic and Detection Fault Collapsing for Multiple Output Circuits
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Journal of Electronic Testing: Theory and Applications
Evaluation of Collapsing Methods for Fault Diagnosis
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Theorems for Fault Collapsing in Combinational Circuits
Journal of Electronic Testing: Theory and Applications
Bilateral Testing of Nano-scale Fault-Tolerant Circuits
Journal of Electronic Testing: Theory and Applications
Improved diagnosis using enhanced fault dominance
Integration, the VLSI Journal
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Nodes in a dominance graph represent faults of a circuit. A Directed edge from node f_i to node f_jmeans that fault f_j dominates f_j. The equivalence of faults f_i and f_j is indicated by the presence of simultaneous edges f_i\to f_j and f_j\to f_i. When local dominance and equivalence relations are included in this graph, its transitive closure provides the collapsed fault sets. Pre-collapsed fault sets of standard cells and other logic blocks can be stored in a graph library for hierarchical fault collapsing. Examples show how more compact fault sets are obtained by using functional equivalences that can be found by analysis of small cells. Benchmark circuits c432 and c499 are used to illustrate the use of functional fault collapsing within their exclusive-OR cells.