Efficient implementation of a BDD package
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
On Dictionary-Based Fault Location in Digital Logic Circuits
IEEE Transactions on Computers
Failure Diagnosis of Structured VLSI
IEEE Design & Test
Advanced Fault Collapsing (Logic Circuits Testing)
IEEE Design & Test
On applying non-classical defect models to automated diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A new path-oriented effect-cause methodology to diagnose delay failures
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm
Proceedings of the IEEE International Test Conference 2001
Exact Computation of Maximally Dominating Faults and Its Application to n-Detection Tests
ATS '02 Proceedings of the 11th Asian Test Symposium
Fault diagnosis based on effect-cause analysis: An introduction
DAC '80 Proceedings of the 17th Design Automation Conference
A Technique for Logic Fault Diagnosis of Interconnect Open Defects
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
A New Algorithm for Global Fault Collapsing into Equivalence and Dominance Sets
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults
VLSID '04 Proceedings of the 17th International Conference on VLSI Design
Diagnostic and Detection Fault Collapsing for Multiple Output Circuits
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Evaluation of Collapsing Methods for Fault Diagnosis
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Dominance Based Analysis for Large Volume Production Fail Diagnosis
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Techniques for improved diagnosis
Techniques for improved diagnosis
Locating bridging faults using dynamically computed stuck-at fault dictionaries
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Defect diagnosis can benefit from fault dominance relations to reduce the set of defect candidate sites. This paper presents new fault dominance collapsing operators that further reduce the set of candidates considered during the initial phase of diagnosis. In contrast to existing dominance-based methods which operate on pairs of faults, the proposed method operates on sets of faults. Fault-related entities are generated to guide the diagnosis process. The proposed collapsing operators can be used to accelerate effect-cause diagnosis. Experimental results demonstrate that the proposed method achieves a higher collapsing ratio than existing methods.