Deviation-based LFSR reseeding for test-data compression
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Improved diagnosis using enhanced fault dominance
Integration, the VLSI Journal
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n-detection test sets for stuck-at faults have been shown tobe useful in detecting unmodeled defects. It was also shownthat a set of faults, called maximally dominating faults, canplay an important role in controlling the increase in the sizeof an n-detection test set as n is increased. In an earlierwork, a superset of the maximally dominating fault set wasused. In this work, we propose a method to determine exactsets of maximally dominating faults. We also define a newtype of n-detection test sets based on the exact set of maximallydominating faults. We present experimental resultsto demonstrate the usefulness of this exact set in producinghigh-quality n-detection test sets. Keywords: Fault dominance, n-detection, formal techniques,BDDs