Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary

Authors:
Wei Zou;Wu-Tung Cheng;Sudhakar M. Reddy;Huaxing Tang
Affiliations:
Mentor Graphics Corporation, USA;Mentor Graphics Corporation, USA;University of Iowa, USA;Mentor Graphics Corporation, USA
Venue:
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Year:
2007

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Abstract

Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, ...