Evaluation of Collapsing Methods for Fault Diagnosis

Authors:
Rajsekhar Adapa;Spyros Tragoudas;Maria K. Michael
Affiliations:
Southern Illinois University Carbondale;Southern Illinois University Carbondale;University of Cyprus
Venue:
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Year:
2006

Citing 4
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Abstract

This paper presents two new single stuck-at fault collapsing methods to reduce the number of tests required for fault diagnosis. The impact of the proposed collapsing methods on diagnosis is evaluated in terms of time and space requirements for the diagnosis process. Experimental comparisons on the ISCAS'85 benchmarks demonstrate the impact of the proposed generalization over the traditional fault collapsing method.