Diagnosis of realistic bridging faults with single stuck-at information
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Oscillation control in logic simulation using dynamic dominance graphs
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Symbolic Handling of Bridging Fault Effects
Journal of Electronic Testing: Theory and Applications
A deductive technique for diagnosis of bridging faults
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Logic Testing of Bridging Faults in CMOS Integrated Circuits
IEEE Transactions on Computers
Defect-oriented mixed-level fault simulation of digital systems-on-a-chip using HDL
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Detection of Defects Using Fault Model Oriented Test Sequences
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Bridging Faults in Pipelined Circuits
Journal of Electronic Testing: Theory and Applications
Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits
Journal of Electronic Testing: Theory and Applications
Modeling the Unmodelable: Algorithmic Fault Diagnosis
IEEE Design & Test
Probabilistic mixed-model fault diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Switch-level bridging fault simulation in the presence of feedbacks
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect-oriented test quality assessment using fault sampling and simulation
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Deterministic test generation for non-classical faults on the gate level
ATS '95 Proceedings of the 4th Asian Test Symposium
Serial transistor network modeling for bridging fault simulation
ATS '95 Proceedings of the 4th Asian Test Symposium
A Parameterizable Fault Simulator for Bridging Faults
ETW '00 Proceedings of the IEEE European Test Workshop
Switch-level modeling of feedback faults using global oscillation control
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Precise Test Generation for Resistive Bridging Faults of CMOS Combinational Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Bridging Fault Extraction from Physical Design Data for Manufacturing Test Development
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Test Strategy Sensitivity to Defect Parameters
ITC '97 Proceedings of the 1997 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting
Journal of Electronic Testing: Theory and Applications
A Comparison of Bridging Fault Simulation Methods
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Resistive Bridge Fault Modeling, Simulation and Test Generation
ITC '99 Proceedings of the 1999 IEEE International Test Conference
On the Characterization of Hard-to-Detect Bridging Faults
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Modeling Feedback Bridging Faults with Non-Zero Resistance
Journal of Electronic Testing: Theory and Applications
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Fault Diagnosis and Fault Model Aliasing
ISVLSI '05 Proceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design
On per-test fault diagnosis using the X-fault model
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Fault diagnosis of physical defects using unknown behavior model
Journal of Computer Science and Technology
Extracting Defect Density and Size Distributions from Product ICs
IEEE Design & Test
Scan chain organization for embedded diagnosis
Proceedings of the conference on Design, automation and test in Europe
Resistive bridging fault simulation of industrial circuits
Proceedings of the conference on Design, automation and test in Europe
A bridging fault model where undetectable faults imply logic redundancy
Proceedings of the conference on Design, automation and test in Europe
How Many Test Vectors We Need to Detect a Bridging Fault?
Journal of Electronic Testing: Theory and Applications
IEICE - Transactions on Information and Systems
Partitioned n-detection test generation
Proceedings of the 19th ACM Great Lakes symposium on VLSI
SUPERB: Simulator utilizing parallel evaluation of resistive bridges
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Test escapes: analysis of short defect
SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design
Parallel X-fault simulation with critical path tracing technique
Proceedings of the Conference on Design, Automation and Test in Europe
Robust fault models where undetectable faults imply logic redundancy
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
CδIDDQ: improving current-based testing and diagnosis through modified test pattern generation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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