Test escapes: analysis of short defect

Authors:
M. Renovell;F. Azaïs;Y. Bertrand
Affiliations:
Laboratoire d'Informatique Robotique Microélectronique de Montpellier LIRMM-UMII, Université de Montpellier II, Sciences et Techniques du Languedoc, UMR, CNRS, Montpellier Cedex 5, Franc ...;Laboratoire d'Informatique Robotique Microélectronique de Montpellier LIRMM-UMII, Université de Montpellier II, Sciences et Techniques du Languedoc, UMR, CNRS, Montpellier Cedex 5, Franc ...;Laboratoire d'Informatique Robotique Microélectronique de Montpellier LIRMM-UMII, Université de Montpellier II, Sciences et Techniques du Languedoc, UMR, CNRS, Montpellier Cedex 5, Franc ...
Venue:
SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design
Year:
1999

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Abstract

This paper analyzes the different types of test escape with the final objective to propose a solution to minimize some of the test escapes. Using a simple example of short defect in the context of Boolean testing, it is first demonstrated that the defect behavior depends on unpredictable parameters. It is shown that a defect may be detectable with a vector but for a given domain of the unpredictable parameter called the Detection Domain. Using the concept of Detection Domain, 3 different types of test escape are identified. It is then demonstrated that one type of test escape can be minimized using 'Improved fault models'.