All Tests for a Fault Are Not Equally Valuable for Defect Detection

Detection of Defects Using Fault Model Oriented Test Sequences

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

Improving Defect Detection in Static-Voltage Testing

IEEE Design & Test

On applying non-classical defect models to automated diagnosis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Enhanced testing performance via unbiased test sets

EDTC '95 Proceedings of the 1995 European conference on Design and Test

Enhanced DO-RE-ME Based Defect Level Prediction Using Defect Site Aggregation-MPG-D

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects

ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design

Test escapes: analysis of short defect

SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design

A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects

Journal of Electronic Testing: Theory and Applications