All Tests for a Fault Are Not Equally Valuable for Defect Detection
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experiment
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
On the decline of testing efficiency as fault coverage approaches 100%
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Defect Level as a Function of Fault Coverage
IEEE Transactions on Computers
Defect-Oriented Testing and Defective-Part-Level Prediction
IEEE Design & Test
A Measure of Quality for n-Detection Test Sets
IEEE Transactions on Computers
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Generation of broadside transition fault test sets that detect four-way bridging faults
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Forming N-detection test sets without test generation
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Partitioned n-detection test generation
Proceedings of the 19th ACM Great Lakes symposium on VLSI
Forward-looking reverse order fault simulation for n-detection test sets
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On clustering of undetectable single stuck-at faults and test quality in full-scan circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Using implications to choose tests through suspect fault identification
ACM Transactions on Design Automation of Electronic Systems (TODAES) - Special section on adaptive power management for energy and temperature-aware computing systems
Multi-pattern n-detection stuck-at test sets for delay defect coverage
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Predicting the final value of the defective part level afterthe application of a set of test vectors is not a simple problem.In order for the defective part level to decrease,both the excitation and observation of defects must occur.This research shows that the probability of the exciting anas yet undetected defect does indeed decrease exponentiallyas the number of observations increases.In addition, a newdefective part level model is proposed which accurately predicts the final defective part level (even at high fault coverages) for several benchmark circuits and which continuesto provide good predictions even as changes are made in the set of test patterns applied.